TY  - CONF

T1  - Reliability of atom column positions in a ternary system determined by quantitative high-resolution transmission electron microscopy

JO  - JOURNAL OF MICROSCOPY-OXFORD

PY  - 1998/04/01

AU  - Kienzle O

AU  - Ernst F

AU  - Mobus G

ED  - 

VL  - 190

SP  - 144

EP  - 158

Y2  - 2025/04/22

ER  -