TY  - CONF

T1  - On the use of CBED-derived and ab-initio scattering factors to check for chemical-bonding sensitive imaging conditions in HREM

JO  - ELECTRON MICROSCOPY 1998, VOL 1

PY  - 1998/01/01

AU  - Mobus G

AU  - Gemming T

ED  - Benavides HAC

ED  - Yacaman MJ

SP  - 123

EP  - 124

Y2  - 2025/04/22

ER  -